Portable multi-function cable tester

ABSTRACT

The methods and apparatus described herein are designed and configured to allow one user to test cable continuity using a wire-configurable directional connector. The methods and apparatus may transmit a first and second voltage pulse through a first and second wire of a cable under test, respectively, having a wire-configurable directional connector attached. Both voltage pulses travel through the wire-configurable directional connector. The first voltage pulse selectively leaves at least one of the second wire and a third wire of the cable under test and the second voltage pulse selectively leaves the third wire. The methods and apparatus may store a pre-determined pattern of a returning voltage pulse specific to the cable under test, and determine a state of the first, second, and third wires in response to receiving the first and second voltage pulses.

CROSS REFERENCE TO RELATED APPLICATION

This non-provisional patent application claims the benefit of andpriority from U.S. provisional patent application No. 61/973,319 filedApr. 1, 2014, the disclosure of which is expressly incorporated hereinby reference.

STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT

The invention described herein may be manufactured, used and licensed byor for the United States Government for any governmental purpose withoutpayment of any royalties thereon. This invention (Navy Case 103,206) isassigned to the United States Government and is available for licensingfor commercial purposes. Licensing and technical inquiries may bedirected to the Technology Transfer Office, Naval Surface Warfare CenterCrane, email: Cran_CTO@navy.mil.

FIELD OF THE DISCLOSURE

The disclosure relates generally to testing cable continuity, and moreparticularly, using a wire-configurable directional connector to testcable continuity.

BACKGROUND

Generally, testing cable continuity requires multiple users located atopposite ends of a cable under test to determine if there are any faultsin the cable, such as open circuits, short circuits, or wires pinnedincorrectly. Cables can be hundreds of feet in length and extend throughmultiple floors or rooms and may require long distance communicationduring testing, such as using hand-held radios. Communication duringtesting may be impeded by lack of radio connectivity, human error, andmiscommunication between technicians resulting in faulty and potentiallydangerous cable tests. There is a need to increase the speed andaccuracy when testing cables and the ability to test cables with only asingle technician.

BRIEF SUMMARY

The methods and system described herein are designed and configured toallow one user to test cable continuity using a wire-configurabledirectional connector. The wire-configurable directional connectorincludes a connection site configured to receive a plurality of wires ofa cable under test at a second end of the cable under test, a pluralityof connection wires configured to receive the plurality of wires fromthe connection site, at least a first diode configured to connect aselected first wire among the plurality of wires with a second wireamong the plurality of wires of the cable under test, and at least asecond diode configured to connect the second wire among the pluralityof wires of the cable under test with a third wire among the pluralityof wires of the cable under test.

The methods and system, illustratively utilizing a wire-specific voltagepulse generation main test unit, may transmit a first voltage pulsethrough a selected first wire among a plurality of wires of a cableunder test, wherein the cable under test has a first end and thewire-configurable directional connector attached to a second end, andtransmit a second voltage pulse through a selected second wire among theplurality of wires of the cable under test. In addition, thewire-specific voltage pulse generation main test unit may store apre-determined pattern of at least one returning voltage pulse specificto the cable under test. A processor within the wire-specific voltagepulse generation main test unit transmits the first voltage pulse toselectively enter the first wire at the first end of the cable undertest, travel through the wire-configurable directional connectorattached to the second end, and selectively leave at least one of thesecond and third wires at the first end of the cable under test. Theprocessor transmits the second voltage pulse to selectively enter thesecond wire at the first end of the cable under test, travel through thewire-configurable directional connector attached to the second end, andselectively leave the third wire. The wire-specific voltage pulsegeneration main test unit may further determine a state of the first,second, and third wires in response to receiving the first and secondvoltage pulses.

Cable tests that can be performed include, but are not limited to: cableshield integrity testing, which tests a cable shield continuity alongthe entire length of the cable under test, open circuit testing, whichtests for open or broken circuits along the entire length of the cableunder test, short circuit testing, which tests a cable under test alongits entire length to find whether a wire within the cable under test isshorted to any other wire within that cable under test, and shorted toshield testing, which tests whether any wire within the cable under testis shorted to the shield.

According to an illustrative embodiment of the present disclosure, anapparatus for testing cable continuity, such as a wire-specific voltagepulse generation main test unit, includes a processor configured totransmit a first voltage pulse through a selected first wire among aplurality of wires of a cable under test, wherein the cable under testhas a first end and a wire-configurable directional connector attachedto a second end, and transmit a second voltage pulse through a selectedsecond wire among the plurality of wires of the cable under test. Thewire-specific voltage pulse generation main test unit further includesmemory configured to store a pre-determined pattern of at least onereturning voltage pulse specific to the cable under test. Thewire-specific voltage pulse generation main test unit further includesan output module operatively connected to the processor and the firstand second wires at the first end of the cable under test. Thewire-specific voltage pulse generation main test unit further includesan input module operatively connected to the processor and the secondwire and a third wire at the first end of the cable under test. Thefirst voltage pulse is directed to selectively enter the first wire atthe first end of the cable under test, travel through thewire-configurable directional connector attached to the second end, andselectively leave at least one of the second and third wires at thefirst end of the cable under test. The second voltage pulse is directedto selectively enter the second wire at the first end of the cable undertest, travel through the wire-configurable directional connectorattached to the second end, and selectively leave the third wire. Theprocessor is configured to determine a state of the first, second, andthird wires in response to receiving the first and second voltagepulses.

According to a further illustrative embodiment of the presentdisclosure, a method of assembly comprises fabricating awire-configurable directional connector and fabricating a wire-specificvoltage pulse generation main test unit

Among other advantages, by using the methods and apparatus describedherein, various capabilities for testing cable continuity may beimproved, such as ease of use by reducing the confusion and timerequired when conducting tests on electronic cables, returning fullyautomated test results to the user through a digital display, requiringlittle or no technical expertise by the user operating the apparatus,and increased trouble shooting speed. Other advantages will berecognized by those of ordinary skill in the art.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a block diagram illustrating one example of an illustrativesystem using an illustrative wire-specific voltage pulse generation maintest unit and an illustrative wire-configurable directional connector.

FIG. 2 shows a block diagram illustrating another example of anillustrative system using an illustrative wire-specific voltage pulsegeneration main test unit and an illustrative wire-configurabledirectional connector.

FIG. 3 shows a flowchart generally illustrating an example of a methodof testing cable continuity using an illustrative wire-specific voltagepulse generation main test unit and an illustrative wire-configurabledirectional connector.

FIG. 4 shows a block diagram illustrating an example of an illustrativefaceplate of an illustrative wire-specific voltage pulse generation maintest unit.

FIG. 5 shows a block diagram illustrating one example of an illustrativeoperator interface of an illustrative faceplate.

FIG. 6 shows a block diagram illustrating another example of anillustrative operator interface of an illustrative faceplate.

FIG. 7 shows a block diagram illustrating another example of anillustrative operator interface of an illustrative faceplate.

FIG. 8 shows a block diagram illustrating another example of anillustrative operator interface of an illustrative faceplate.

FIG. 9 shows a block diagram illustrating another example of anillustrative operator interface of an illustrative faceplate.

FIG. 10 shows a block diagram illustrating another example of anillustrative operator interface of an illustrative faceplate.

FIG. 11 shows a block diagram illustrating another example of anillustrative operator interface of an illustrative faceplate.

FIG. 12 shows a block diagram illustrating one example of anillustrative wire-configurable directional connector.

FIG. 13 shows a block diagram illustrating one example of anillustrative external power source.

FIG. 14 shows a block diagram illustrating one example of anillustrative component layout of an illustrative chassis.

FIG. 15 shows a block diagram of an illustrative chassis and anillustrative underside of an illustrative faceplate.

FIG. 16 shows an example of several subroutines executed by anillustrative wire-specific voltage pulse generation main test unit.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIG. 1 shows a block diagram illustrating one example of a system 100employing an apparatus 102, such as a wire-specific voltage pulsegeneration main test unit (MTU 102), a cable under test 104, and awire-configurable directional connector 112. In this example, the cableunder test 104 comprises a first wire, a second wire, and a third wire,such as wire 106, wire 108, and wire 110, respectively. Those ofordinary skill in the art will recognize that the cable under test 104may comprise any number of wires.

MTU 102 may be supported by a chassis and stored in a protective case,such as a pelican case, that allows for protection from shock andenvironmental hazards. Further, MTU 102 may be powered by either anexternal power source directly attached to the MTU 102 or by using apermanent power source, such as a ship power or a wall outlet, byconnecting a power cable from the permanent power source to the MTU 102via a power input connector. The external power source can be usedinstead of the permanent power source to provide a user with the abilityto use the MTU 102 away from the permanent power source or when thepermanent power source is unavailable.

The wire-configurable directional connector 112 may be comprised ofmultiple one-way jumpers or diodes, which allow voltage pulses that aretransmitted by the MTU 102 to return to the MTU 102 in certainpre-determined patterns. For example, wires 106, 108, and 110 in thecable under test 104 are pulsed independently by the MTU 102 and thepattern of returning pulses are then compared to a pre-determinedpattern list that is specific to the cable under test 104. If a diodeconnects wires 106 and 108, and another diode connects wires 108 and110, a voltage pulse may be directed to selectively enter wire 106 atthe first end of the cable under test 104, travel through thewire-configurable directional connector 112 attached to the second endof the cable under test 104, and selectively leave wire 108 at the firstend of the cable under test 104. Another voltage pulse may be directedto selectively enter wire 108 at the first end of the cable under test104, travel through the wire-configurable directional connector 112attached to the second end of the cable under test 104, and selectivelyleave wire 110. An analysis of these patterns of returning voltages atthe first end of the cable under test 104 by the MTU 102 can then beused to determine certain faults in the cable under test 104 if any.

Different cables for testing may have different pre-determined patternlists. Accordingly, the wire-configurable directional connector 112 isspecifically designed for one cable under test to provide thepre-determined pattern list consistently upon each test. In thisexample, wire-configurable directional connector 112 is speciallydesigned for the cable under test 104. Thus, each cable under testgenerally requires its own corresponding wire-configurable directionalconnector, unless the internal wiring of one cable under test issubstantially similar to that of another cable under test.

The MTU 102 is coupled to the cable under test 104 via communicationlink 114. The cable under test 104 is coupled to the wire-configurabledirectional connector 112 via communication link 116.

FIG. 2 shows a block diagram illustrating one example of the system 100employing the MTU 102, the cable under test 104, and thewire-configurable directional connector 112. In this example, the MTU102 comprises a processor 200, an output module 202, an input module204, a display 206, and memory 208. Although the memory 208 is shown inas separate from the processor 200, it may be a part of the processor200.

The processor 200 may include one or more processors that may be a hostcentral processing unit (CPU) having one or multiple cores, a generalprocessor such as an accelerated processing unit (APU), or any othersuitable processor. An example is the Allen Bradley Micrologix 1100Processor w/(10) 24 VDC inputs and (4) DC outputs. The processor 200 mayoperate in combination with any suitable executing software module,hardware, or executing firmware. The processor 200 may communicate withmemory 208 via communication link 220 to execute instructions stored inmemory 208 to send out a voltage pulse, such as a voltage of directcurrent (VDC) signal, via the output module 202, such as a voltagegenerator. For example, the instructions may be a bit sequence, such as“111,” in which upon receipt, the output module 202 may send threevoltage pulses individually to wires 106-110, respectively, where a bit“1” reflects high voltage, and a bit “0” reflects low voltage. Memory208 may be include a read only memory (ROM), a random access memory(RAM), a register, cache memory, semiconductor memory devices, magneticmedia such as internal hard disks and removable disks, magneto-opticalmedia, and optical media such as CD-ROM disks, and digital versatiledisks (DVDs).

The memory 208 may contain preprogrammed test sequences for a pluralityof different cables to be tested, and may also be programmable foradditional or removal of other cables for testing. The memory 208 mayalso contain the pre-determined pattern list provided by thewire-configurable directional connector 112. For example, the testsequences may be associated with the pre-determined pattern list and mayspecify the number of voltage pulses, the voltage level of the voltagepulses, and the likes. The voltage pulse is returned via the inputmodule 204, such as a voltage comparator, and communicated back to theprocessor 200 via communication link 216.

The input module 204 compares the returned voltage pulse with itsassociated voltage threshold. For example, if the returned voltage pulseis a 24 VDC signal and its associated voltage threshold is 10V, theinput module 204 compares the 24 VDC signal and its associated voltagethreshold. Since the 24 VDC signal is greater than the voltage thresholdof 10V, the input module 204 may communicate back to the processor 200that a return voltage pulse was properly received, which may berepresented as a bit “1.” The MTU 102 may use a 24 VDC power source witha 2 amperage (A) current rating, but other ratings are contemplated tomeet different needs.

Because the cable under test 104 may comprise a plurality of wires, aplurality of voltage pulses needs to be generated. The process 200 maysend a voltage pulse through the output module 202, where the voltagepulse is passed through a voltage divider and an at least one DC voltageisolation relay through a test pulse current limiter to provide theplurality of voltage pulses.

The display 206 is coupled to the processor 200 via communication link218 to display an operator interface and test results. Accordingly, thecommunication link 218 allows transfer of information from the processor200 to the display 206 for display and user inputs from the display 206to the processor 200 to control various cable tests. The communicationlinks 214, 216, 218, and 220 may be buses, ribbon cables, or any othersuitable links.

When the MTU 102 transmits a voltage pulse via the output module 202,the voltage pulse is transmitted to a specific wire, such as wire 106,as shown by arrow 222. The voltage pulse leaves the wire 106 and istransmitted to a diode 210 within the wire-configurable directionalconnector 112 via communication link 116. The diode 210 couples wire 106with another specific wire, such as wire 108. Because wire 108 is alsocoupled to wire 110 by another diode 212, the voltage pulse istransmitted and returned to the MTU 102 via the input module 204 onwires 108 and 110 due to forward bias of diodes 210 and 212, as shown byarrows 224 and 226. Accordingly, the voltage pulse that originated froma specific wire, namely wire 106, is returned on another specific wireor a group of specific wires, namely wires 108 and 110. If the voltagepulse had originally been transmitted to a different specific wire, suchas wire 108 instead of wire 106, due to reverse bias of diode 210, thevoltage pulse would not have been transmitted and returned to the MTU102 on wire 106. However, the voltage pulse would still have beentransmitted to wire 110 due to forward bias of diode 212.

The processor 200 subsequently determines a state of the wires 106-110in response to receiving voltage pulses returned from wires 108 and 110by comparing the voltage pulses that leaves wires 108 and 110 from thefirst end of the cable under test 104 with the pre-determined patternlist in memory 208 associated with both the cable under test 104 and thewire-configurable directional connector 112. For example, voltage pulsesthat leave wires 108 and 110 from the first end of the cable under test104 may be in the form of an actual bit file. The actual bit filecontains a bit sequence indicative of the actual continuity between thecable under test 104 and the wire-configurable directional connector112. For instance, if voltage pulses are present from wires 108 and 110,the bit sequence may be “11.”

In addition, the pre-determined pattern list in memory 208 may be amaster bit file prepopulated with data pertinent to a plurality ofcables for testing, including the cable under test 104, and a pluralityof associated wire-configurable directional connectors, including thewire-configurable directional connector 112. A knowledgeable userconcerning proper operation of the plurality of cables for testing andthe plurality of wire-configurable directional connectors may populatethe master bit file for provisioning into memory 208. The master bitfile contains a plurality of bit sequences indicative of propercontinuity between the cable under test 104 and the wire-configurabledirectional connector 112. The knowledgeable user may be the usertesting the cable, or may be a manufacturer of at least one of theplurality of cables for testing and the plurality of wire-configurabledirectional connectors. For example, if the interaction between thecable under test 104 and wire-configurable directional connector 112allows for return voltage pulses on wires 106-110, the master bit filemay include a bit sequence of “111.”

The processor 200 is configured to retrieve both the actual bit file andthe master bit file from memory 208 to compare both files. If theprocessor 200 determines that the actual bit file and the master bitfile are equivalent, the processor 200 is able to provide a reading tothe user that the cable under test 104 is “good,” or a cable with propercontinuity. If the actual bit file and the master bit file aredetermined to be different, the processor 200 is able to provide areading to the user that the cable under test 104 contains a fault.

Executable instructions stored in memory 208 executed by the processor200 can be used to transmit a voltage pulse and compare the voltagepulse with the pre-determined pattern list to determine a state of thewires in response to the comparison. The instructions can refer toprofiles associated with each cable under test, where each profilecomprises various information, such as the correspondingwire-configurable directional connector for the cable under test, thenumber of wires that comprise the cable under test, the configuration ofthe pattern list, and the likes.

The communication link 114 may comprise a cable connection site 228attached to the MTU 102, a main test cable 230, and a cable adapter 232.The main test cable 230 may be a universal cable that is configured tobe operatively coupled to the cable adapter 232. The cable adapter 232may be adapted for each cable under test 104. MTU 102 may connect to afirst end of the main test cable 230 at the cable connection site 228. Asecond end of the main test cable 230 may be configured to connect to afirst end of the cable adapter 232. A second end of the cable adapter232 may be configured to connect to the cable under test 104. Thecommunication link 116 may comprise a connection site designed to matewith the specified cable under test 104. Advantages of using the maintest cable and the cable adapter allow the user to merely interchangeother adapters that fit the cable under test. However, othercommunication links are contemplated. For instance, the cable under test104 may directly be coupled to the MTU 104. Advantages include notrequiring the main test cable and adapter cable.

FIG. 3 shows a flowchart generally illustrating an example of a method300 of testing cable continuity using the MTU 102. Particularly, FIG. 3may be performed by the processor 200 of FIG. 2. As shown in block 302,the method 300 includes transmitting a first voltage pulse through theselected first wire 106 among a plurality of wires 106, 108, and 110 ofthe cable under test 104, wherein the cable under test 104 has a firstend and the wire-configurable directional connector 112 attached to asecond end, and transmitting a second voltage pulse through the selectedsecond wire 108 among the plurality of wires 106, 108, and 110 of thecable under test 104. As shown in block 304, the method 300 includesstoring, in memory 208, a pre-determined pattern of at least onereturning voltage pulse specific to the cable under test 104, whereinthe first voltage pulse is directed to selectively enter the first wire106 at the first end of the cable under test 104, travel through thewire-configurable directional connector 112 attached to the second end,and selectively leave at least one of the second wire 108 and third wire110 at the first end of the cable under test 104, and wherein the secondvoltage pulse is directed to selectively enter the second wire 108 atthe first end of the cable under test 104, travel through thewire-configurable directional connector 112 attached to the second endof the cable under test 104, and selectively leave the third wire 110.As shown in block 306, the method 300 includes determining a state ofthe wires 106-110 in response to receiving the first and second voltagepulses. The state may describe the cable shield integrity, any potentialopen circuit, any potential short circuit, or any potential shortcircuit to shield.

FIG. 4 shows a block diagram illustrating an example of a faceplate 400of the apparatus 100. The faceplate 400 encompasses the MTU 102 and isconnected to the chassis through suitable communication links such asribbon cables. In this example, the faceplate 400 comprises the display206, and a plurality of various controls and indicators designated as402-426. Although various controls and indicators designated as 402-424are depicted below, those of ordinary skill in the art will appreciateany variations of the configuration described below.

The display 206 displays an operator interface, which may include touchscreen capabilities, to control the processor 200 and to display testresults for the user. Indicator 402 is a power indicator light-emittingdiode (LED) that illuminates to indicate that a power input, such asfrom an external power source or a permanent power source, is providedto the MTU 102 at a power input receiver 404. For example, the externalpower source may be attached to the MTU 102 by inserting an externalpower source cable coupled to the external power source into the powerinput receiver 404. When external power is being supplied, a dedicatedLED 406 illuminates. When permanent power is being supplied, a dedicatedLED 408 illuminates.

A main power switch 410 turns the MTU 102 on and off. A reverse polarityindicator 412 is a different colored LED that indicates whether thecorrect polarity of the power input is provided to the MTU 102. Forexample, if the polarity of the power input is incorrect, the reversepolarity indicator 412 may illuminate to provide the user a warning todisconnect power and address the problem.

The MTU 102 may further require specific pre-determined amperage. Toensure that the MTU 102 is receiving the proper pre-determined amperage,an amperage fuse 414 is located on the faceplate 400 that will restrictthe amperage to the MTU 102.

Indicators 416, 418, and 420 are power indicator LEDs that illuminate toindicate which wires of the cable under test 104, such as wires 106,108, and 110, are supplied with voltage pulses. Manual increase 422 andmanual decrease 424 buttons allow the user to manually apply a voltagepulse to the individual wires 106, 108, and 110 during the test. A faultbuzzer 426 indicates to the user that a fault was discovered during thetest in order to supply an audible warning to the user in addition tovisual indications.

FIGS. 5-11 illustrate various examples of what may be displayed on theoperator interface via the display 206. The sequence of examples depictsone example in which the user may use the operator interface. Those ofordinary skill in the art will understand that the sequence can beprogrammed to meet the needs of the test to be performed.

In FIG. 5, the user is presented with screen icons 500-510 to selectwhich cable to be tested. In this example, the MTU 102 is alreadyprogrammed to test for cables 1-6 as depicted by the screen icons500-510, respectively. For example, cable 1 may be cable under test 104.The user can also be given the opportunity to de-select the selectedcable under test 104 by pressing screen icon 512 or return to the mainmenu by pressing screen icon 514.

The user is brought to the screen shown in FIG. 6 after the user hasindicated the specified cable under test 104 and appropriately havingpressed screen icon 500. In FIG. 6, the user is presented with screenicons 600 and 602 to select which mode, either automatic mode or manualmode, respectively, to test the selected cable under test 104. Theautomatic mode automatically tests all individual wires, whereas themanual mode requests a specified wire to test from the user. As in FIG.5, the user is given the opportunity to de-select the selected cableunder test 104 by pressing screen icon 512 or return to the main menu bypressing screen icon 514.

The user is brought to the screen shown in FIG. 7 after the user hasdesired for an automatic mode test and appropriately having pressedscreen icon 600. A wire-configurable directional connector icon 706 willbe displayed to indicate which wire-configurable directional connector,such as the wire-configurable directional connector 112, is connected tothe cable under test 104 and may provide identification information suchas the serial number of the wire-configurable directional connector. Awire icon 700 depicting the individual wires of the cable under test 104is displayed indicating all wires associated with the cable under test104. The individual wires are each associated with a colored top barindicating that the MTU 102 is sending a voltage pulse through adesignated wire and a colored bottom bar indicating that there is areturning voltage pulse from another designated wire. A shield indicatoricon 704 illuminates when voltage is detected on the cable shieldindicating a live reading which would be a fault in the cable under test104 and requires follow up action by the user. A shield accept icon 720illuminates if the automatic test has determined that the shield of thecable under test 104 is intact and there are no faults related to thecable under test 104. A sequence pointer icon 702 is displayed to denotewhich wire is being tested at a particular moment in time. An info &status icon 708 can be touched to display instructions for the user anddisplay a test status while the test is in progress. A cable info icon718 when touched displays information relative to the cable under test104, such as the particular model, serial number, whether any adaptersare needed, and the likes. As in FIG. 5, the screen icon 514 will returnthe user to the main menu.

A start icon 714 and stop icon 716 can be touched to start and stop theautomatic test. The user may select a reset icon 712 to reset the testand return to the start of the test. The user can toggle to the manualmode by touching the screen icon 602. To continue an automatic testafter the MTU 102 has encountered a test fault, the user can touch anAck Fault icon 710.

The user is brought to the screen shown in FIG. 8 after the user hasdesired for a manual mode test and appropriately having pressed screenicon 602 depicted in FIG. 6. A wire icon 800 depicting the individualwires of the cable under test 104 is displayed indicating both theselected wire in which the user desires to send a voltage pulse to andall wires associated with the cable under test 104. The individual wiresare each associated with a colored top bar indicating that the MTU 102is sending a voltage pulse through a designated wire and a coloredbottom bar indicating that there is a returning voltage pulse fromanother designated wire. The voltage pulse, such as a 24 VDC signal,will be applied to the selected wire. The applied voltage and currentamp draw may also be displayed on the operator interface, such as in thedisplay associate with the info & status icon 708.

Similar to FIG. 7, the wire-configurable directional connector icon 706will be displayed to indicate which wire-configurable directionalconnector is connected to the cable under test 104 and may provideinformation such as the serial number of the wire-configurabledirectional connector. For example, if the cable under test 104 has anassociated wire-configurable directional connector 112, thewire-configurable directional connector icon 706 would displayinformation pertinent to wire-configurable directional connector 112.The shield indicator icon 704 illuminates when voltage is detected onthe cable shield indicating a live reading which would be a fault in thecable under test 104 and requires follow up action by the user. Thesequence pointer icon 702 is displayed to denote which wire is beingtested at a particular moment in time. In this example, sequence pointericon 702 shows wire 106 as the wire being tested currently. The sequencepointer icon 702 can also display a colored bar on the top of the iconindicating that the MTU 102 is sending the voltage pulse through thedesignated wire and a colored bar on the bottom of the icon indicatingthat there is a return voltage pulse returning from the designated wire.Individual wires to be tested can be cycled through manually bydepressing the manual increase 422 and manual decrease 424 buttons asdepicted in FIG. 4. Touching the all wires icon 822 will allow the userto advance through all wires in a pre-determined sequence.

An info & status icon 708 can be touched to display instructions for theuser and display a test status while the test is in progress. The cableinfo icon 718 when touched displays information relative to the cableunder test 104, such as the particular model, serial number, whether anyadapters are needed, and the likes. As in FIG. 5, the screen icon 514will return the user to the main menu.

The start icon 714 and stop icon 716 can be touched to start and stopthe manual test. Specifically, the start icon 714 and stop icon 716start or stop sending power through the designated wire for testing. Theuser may select the reset icon 712 to reset the test and return to thestart of the test. The user can toggle to the automatic mode by touchingthe auto mode icon 602. To continue an automatic test after the MTU 102has encountered a test fault, the user can touch the Ack fault icon 710.

The user is brought to the screen shown in FIG. 9 after the user hasdesired for either a manual or automatic testing of wires 106-110,respectively. FIG. 9 describes a detailed table 900 displaying theresults of the test per wire, a summary table 902 displaying the overallconclusion based on the results of the test per wire, and the screenicon 514 to return to the main menu upon selection. The table 900represents an example of the actual bit file. In this example, a shieldtest may be preliminarily performed. A voltage pulse may be applied tothe shield of the cable under test 104. If the wire-configurabledirectional connector 112 is wired to couple the shield to each of thewires 106-110, and if the voltage pulse returns individually from thewires 106-110, the shield associated with the wires 106-110 has propercontinuity at each end of the cable under test 104. Bit 0 across thewires 106-110 denotes the shield associated with the cable under test104 having proper continuity. If the shield is not properly connected,the test sequence is halted and an audible alarm may sound to let theuser know of a faulty shield. The user has the choice of acknowledgingthe fault and continuing with testing or aborting the test.

After a properly connected shield is determined, tests can be run todetermine if any of the wires of the cable under test 104 are shorted tothe shield. The results of the detailed table 900 are associated withthe configuration of the apparatus 100 of FIG. 2. For example, thevoltage pulse is transmitted to wire 106. If the cable under test 104does not comprise of any wires shorted to the shield, wire 108 and wire110 also receive the voltage pulse due to the forward bias of diodes 210and 212. The presence of a voltage pulse on each wire is denoted by bit1 across all wires in step 1 of the detailed table 900. Next, as denotedin step 2, when the voltage pulse is transmitted to wire 108, wire 110also receives the voltage pulse due to the forward bias of diode 212.However, wire 106 does not receive the voltage pulse due to the reversebias of diode 210. The lack of a presence of a voltage pulse on wire 106is denoted by bit 0 of the detailed table 900. Lastly, as denoted instep 3, when the voltage pulse is transmitted to wire 110, wire 106 andwire 108 do not receive the voltage pulse due to the reverse bias ofdiodes 210 and 212. The lack of a presence of a voltage pulse on wire106 and wire 108 is denoted by bit 0 of the detailed table 900. Becausethe cable under test 104 does not comprise of any wires shorted to eachother, the summary table 902 may display an indicator such as “GOOD,”indicating that the cable under test 104 is free of any short circuits.Accordingly, the processor 200 determines that the actual bit file andthe master bit file are equivalent in this example.

Similarly, FIG. 10 describes an example of the cable under test 104 thatcomprises a short circuit. For example, the voltage pulse is transmittedto wire 106. Wire 108 and wire 110 also receive the voltage pulse due tothe forward bias of diodes 210 and 212. The presence of a voltage pulseon each wire is denoted by bit 1 across all wires in step 1 of thedetailed table 1000. The table 100 represents an example of the actualbit file. Next, as denoted in step 2, when the voltage pulse istransmitted to wire 108, wire 110 also receives the voltage pulse due tothe forward bias of diode 212. However, wire 106 does not receive thevoltage pulse due to the reverse bias of diode 210. The lack of apresence of a voltage pulse on wire 106 is denoted by bit 0 of thedetailed table 1000. Lastly, as denoted in step 3, when the voltagepulse is transmitted to wire 110, both wire 106 and wire 108 should notreceive the voltage pulse due to the reverse bias of diodes 210 and 212if either of wire 106 and wire 108 are not shorted to wire 110. However,because wire 108 is shorted to wire 110, the presence of a voltage pulseon wire 10 is denoted by bit 1 of the detailed table 1000. Because thecable under test 104 comprises a short circuit, the summary table 1002may display an indicator such as “108 & 110 SHORTED AT STEP 3,”indicating that the cable under test 104 includes a short circuit.Accordingly, the processor 200 determines that the actual bit file andthe master bit file are not equivalent in this example. The user maythen identify that the problem with the cable under test 104 is limitedto wire 108 shorted to wire 110.

FIG. 11 describes an example of the cable under test 104 that comprisesa short to shield. In this example, a shield test is performed. Avoltage pulse may be applied to the shield of the cable under test 104.If the wire-configurable directional connector 112 is wired to couplethe shield to each of the wires 106-110, and if the voltage pulsereturns individually from the wires 106-110, the shield associated withthe wire 106 has proper continuity at each end of the cable under test104. Bit 0 across the wire 106 and wire 110 denotes the shieldassociated with the cable under test 104 having proper continuity.However, bit 1 across the wire 108 denotes wire 108 shorted to theshield. As can be seen from the detailed table 1100, which represents anexample of the actual bit file, had the shield test not have beenpreliminary performed, a short to shield may not have been detected.Because the cable under test 104 comprises a short to shield, thesummary table 1102 may display an indicator such as “108 SHORTED TOSHIELD,” indicating that the cable under test 104 includes a short toshield. Accordingly, the processor 200 determines that the actual bitfile and the master bit file are not equivalent in this example. Theuser may then identify that the problem with the cable under test 104 islimited to wire 108.

FIG. 12 shows a block diagram illustrating one example of thewire-configurable directional connector 112. The wire-configurabledirectional connector 112 includes a connection site 1200 configured toreceive the plurality of wires, such as wires 106-110, at the second endof the cable under test 104. Specifically, a plurality of connectionwires 1202, which may be exposed, are configured to receive theplurality of wires from the connection site 1200. At least one diode,such as diode 210 or diode 212, is configured to connect a selectedfirst wire among the plurality of wires with a second wire among theplurality of wires of the cable under test 104. The diode facilitatestransmittal of a voltage pulse from the selected first wire to thesecond wire at the second end of the cable under test 104. Theconnection site 1200 is fabricated to meet specifications of aparticular cable under test.

FIG. 13 shows a block diagram illustrating one example of an externalpower source 1300. The external power source 1300 is directly attachedto the MTU 102 by inserting an external power source cable 1302 into thepower input receiver 404. When external power is being supplied, adedicated LED 406 illuminates. When permanent power is being supplied, adedicated LED 408 illuminates. The external power source 1300 may be a24 VDC power source with a 2 A current rating, but other ratings arecontemplated to meet different needs.

FIG. 14 shows a block diagram illustrating one example of a componentlayout of a chassis. Chassis 1400 may be designed such that it iscontained within a protective case and located under and connected tothe faceplate 400. Chassis 1400 includes the processor 200. Theprocessor 200 is operatively connected to the output module 202 and theinput module 204. The processor 200 sends the voltage pulse through theoutput module 202 through ribbon cables to a plurality of ribbon cableterminal blocks 1404 where the applied system voltage is passed througha voltage divider 1406 to monitor the applied system voltage level. Thevoltage pulse travels through a pre-determined wire in the cable undertest 104 to the wire-configurable directional connector 112 and backthrough the cable under test 104 on a different pre-determined wire. Thepre-determined voltage pulse is then relayed through the input module204. The voltage pulse is then directed to the processor 200 foranalysis. Isolation relays 1408 insure the applied external power source1300 is of the correct polarity.

FIG. 15 shows a block diagram of the chassis 1400 and the underside ofthe faceplate 400. The chassis 1400 and the faceplate 400 are configuredto fit within the protective case 1500. The faceplate 400 and thechassis 1400 are connected through a ribbon cable 1502 which transfersinformation from the processor 200 to the operator interface via display206 and user inputs from the operator interface to the processor 200 tocontrol the various preprogrammed cable tests. Manual increase 422 andmanual decrease 424 buttons are located on the faceplate 400, both ofwhich allow the user to manually apply a voltage pulse to the individualwires 106, 108, and 110 during the test. A fault buzzer 426 is locatedon the faceplate 400 and is used to indicate to the user that a faultwas discovered during the test in order to supply an audible warning tothe user in addition to visual indications. The main power switch 410 onthe faceplate 400 can be used to turn an MTU 102 on and off. Dependingon the type of power supplied, either a dedicated LED 406 or dedicatedLED 408, both on the faceplate 400, may illuminate. The chassis 1400also includes a power input connector 1504 to receive a power cable fromthe power source. The cable connection site 228 located on the chassis1400 may receive the main test cable 230. The test pulse current limiter1506 is also shown on the chassis 1400.

FIG. 16 shows an example of several subroutines executed by anillustrative apparatus. When a user for example presses the start icon714 to start an automatic test, the processor 200 loads up all thesubroutines via subroutine 2, which is indicated as “MAIN_PROG.”Subroutine 3 indicated as “SEQUENCE” is executed by the processor 200 ofthe MTU 102. The counter indicated as “C5:0” in the appendix indicatesthe number of wires of the cable under test. The subroutine 3 isconfigured to allow the output module 202 to send out a voltage pulse,for example on wire 106, if the counter indicates a value of “1.”Further, the subroutine 3 is configured to send out a voltage pulse, forexample on wire 108, if the counter indicates a value of “2.” The outputmodule 202 may execute a subroutine 6 in order to sequentially transmita first voltage pulse through a selected first wire and then a secondvoltage pulse through a selected second wire among the plurality ofwires of the cable under test 104. In addition, after the user hasselected the cable under test, the MTU 102, particularly processor 200may execute a subroutine 12, indicated as “RECIPIE LD” to provision amaster bit file indicative of proper continuity between the cable undertest and the wire-configurable directional connector into the memory208. Subroutine 5 indicated as “INPUTS” is executed by the processor 200and the input module 202 of the MTU 102. The destination registerindicated as “Dest” is used to represent the returned voltage pulses, asshown in the appendix. Although “Dest” is presented as zero signifyingno returned voltage pulses for all positions of register “B,” non-zerovalues signify returned voltages. The processor 200 may executesubroutine 8, which is indicated as “MESSAGES,” in conjunction with thedisplay 206, to display test results. Although the subroutines arepresented in a specified order for illustration purposes, the order ofthe subroutines may vary. In addition, one of ordinary skill in the artmay view the attached appendix to understand further details of theoperation concerning the MTU 102. The appendix is incorporated byreference herein.

Among other advantages, by using the methods and apparatus describedherein, various capabilities for testing cable continuity may beimproved, such as ease of use by reducing the confusion and timerequired when conducting tests on electronic cables, returning fullyautomated test results to the user through a digital display, requiringlittle or no technical expertise by the user operating the system, andincreased trouble shooting speed. Other advantages will be recognized bythose of ordinary skill in the art.

While various aspects and embodiments have been disclosed herein, otheraspects and embodiments will be apparent to those skilled in the art.The various aspects and embodiments disclosed herein are for purposes ofillustration and are not intended to be limiting, with the true scopeand spirit being indicated by the following claims. Other embodimentsmay be utilized, and other changes may be made, without departing fromthe spirit or scope of the subject matter presented herein. It will bereadily understood that the aspects of the present disclosure, asgenerally described herein and illustrated in the figures, can bearranged, substituted, combined, separated, and designed in a widevariety of different configurations, all of which are contemplatedherein.

What is claimed is:
 1. An apparatus for testing cable continuitycomprising: a processor configured to transmit a first voltage pulsethrough a selected first wire among a plurality of wires of a cableunder test, wherein the cable under test has a first end and awire-configurable directional connector attached to a second end, and asecond voltage pulse through a selected second wire among the pluralityof wires of the cable under test; memory configured to store apre-determined pattern of at least one returning voltage pulse specificto the cable under test; an output module operatively connected to theprocessor and the first and second wires at the first end of the cableunder test; an input module operatively connected to the processor andthe second wire and a third wire at the first end of the cable undertest, wherein the first voltage pulse is directed to selectively enterthe first wire at the first end of the cable under test, travel throughthe wire-configurable directional connector attached to the second end,and selectively leave at least one of the second and third wires at thefirst end of the cable under test, wherein the second voltage pulse isdirected to selectively enter the second wire at the first end of thecable under test, travel through the wire-configurable directionalconnector attached to the second end, and selectively leave the thirdwire, and wherein the processor is configured to determine a state ofthe first, second, and third wires in response to receiving the firstand second voltage pulses.
 2. The apparatus of claim 1, wherein theprocessor is configured to compare the first and second voltage pulseswith the pre-determined pattern of at the least one returning voltagepulse stored in memory to determine the state of the first, second, andthird wires.
 3. The apparatus of claim 1, wherein the state of thefirst, second, and third wires includes at least one of cable shieldintegrity, open circuits, short circuits, and shorted to shield.
 4. Theapparatus of claim 3, wherein the apparatus is connected to a faceplateand is enclosed within a protective box.
 5. The apparatus of claim 4,wherein the faceplate comprises an operator interface adapted to be atouch screen display to control the apparatus and display test results.6. The apparatus of claim 5, wherein the operator interface isconfigured to display a plurality of cables for testing, including thecable under test.
 7. The apparatus of claim 5, wherein the operatorinterface is configured to display the plurality of wires of the cableunder test.
 8. The apparatus of claim 5, wherein the operator interfaceis configured to manually test the selected first wire among theplurality of wires of the cable under test.
 9. The apparatus of claim 5,wherein the operator interface is configured to automatically test allof the plurality of wires of the cable under test.
 10. The apparatus ofclaim 5, wherein the faceplate further comprises at least one buttonadapted to interface with the operator interface for manually applyingthe first and second voltage pulses to the selected first and secondwires among the plurality of wires of the cable under test.
 11. A methodof testing cable continuity comprising: transmitting, by a processor, afirst voltage pulse through a selected first wire among a plurality ofwires of a cable under test, wherein the cable under test has a firstend and a wire-configurable directional connector attached to a secondend, and a second voltage pulse through a selected second wire among theplurality of wires of the cable under test; storing, in memory, apre-determined pattern of at least one returning voltage pulse specificto the cable under test, wherein the first voltage pulse is directed toselectively enter the first wire at the first end of the cable undertest, travel through the wire-configurable directional connectorattached to the second end, and selectively leave at least one of thesecond and third wires at the first end of the cable under test, whereinthe second voltage pulse is directed to selectively enter the secondwire at the first end of the cable under test, travel through thewire-configurable directional connector attached to the second end, andselectively leave the third wire; and determining, by the processor, astate of the first, second, and third wires in response to receiving thefirst and second voltage pulses.
 12. The method of claim 11, furthercomprising: comparing, by the processor, the first and second voltagepulses with the pre-determined pattern of at the least one returningvoltage pulse stored in memory; and determining the state of the first,second, and third wires in response to the comparing.
 13. The method ofclaim 11, wherein the state of the first, second, and third wiresincludes at least one of cable shield integrity, open circuits, shortcircuits, and shorted to shield.
 14. The method of claim 13, wherein atleast the processor is operatively connected to a faceplate and isenclosed within a protective box.
 15. The method of claim 14, furthercomprising: displaying, by an operator interface operatively connectedto the faceplate, data to control the method and display test results.16. The method of claim 15, wherein displaying further comprises:displaying a plurality of cables for testing, including the cable undertest.
 17. The method of claim 15, displaying further comprises:displaying the plurality of wires of the cable under test.
 18. Themethod of claim 15, further comprising: manually testing the selectedfirst and second wires among the plurality of wires of the cable undertest.
 19. The method of claim 15, further comprising: automaticallytesting all of the plurality of wires of the cable under test.
 20. Themethod of claim 15, further comprising: manually applying, by at leastone button adapted to interface with the operator interface, the firstand second voltage pulses to the selected first and second wires amongthe plurality of wires of the cable under test.
 21. A wire-configurabledirectional connector comprising: a connection site configured toreceive a plurality of wires of a cable under test at a second end ofthe cable under test; a plurality of connection wires configured toreceive the plurality of wires from the connection site; at least afirst diode configured to connect a selected first wire among theplurality of wires with a second wire among the plurality of wires ofthe cable under test; and at least a second diode configured to connectthe second wire among the plurality of wires of the cable under testwith a third wire among the plurality of wires of the cable under test,wherein the first and second diodes facilitate transmittal of a firstand second voltage pulse from the selected first wire to the second wireand from the selected second wire to the third wire at the second end ofthe cable under test.
 22. The wire-configurable directional connector ofclaim 21, wherein the connection site is fabricated to meetspecifications of a particular cable under test.
 23. Thewire-configurable directional connector of claim 21, wherein theplurality of connection wires are exposed.
 24. A system for testingcable continuity comprising: a cable under test; a wire-configurabledirectional connector; a wire-specific voltage pulse generation maintest unit comprising: a processor configured to transmit a first voltagepulse through a selected first wire among a plurality of wires of thecable under test, wherein the cable under test has a first end and thewire-configurable directional connector attached to a second end, and asecond voltage pulse through a selected second wire among the pluralityof wires of the cable under test; memory configured to store apre-determined pattern of at least one returning voltage pulse specificto the cable under test; an output module operatively connected to theprocessor and the first and second wires at the first end of the cableunder test; an input module operatively connected to the processor andthe second wire and a third wire at the first end of the cable undertest, wherein the first voltage pulse is directed to selectively enterthe first wire at the first end of the cable under test, travel throughthe wire-configurable directional connector attached to the second end,and selectively leave at least one of the second and third wires at thefirst end of the cable under test, wherein the second voltage pulse isdirected to selectively enter the second wire at the first end of thecable under test, travel through the wire-configurable directionalconnector attached to the second end, and selectively leave the thirdwire, and wherein the processor is configured to determine a state ofthe first, second, and third wires in response to receiving the firstand second voltage pulses.
 25. The system of claim 24, wherein thewire-configurable directional connector further comprises: a connectionsite configured to receive the plurality of wires of the cable undertest at the second end of the cable under test; a plurality ofconnection wires configured to receive the plurality of wires from theconnection site; at least a first diode configured to connect theselected first wire among the plurality of wires with the second wireamong the plurality of wires of the cable under test; and at least asecond diode configured to connect the second wire among the pluralityof wires of the cable under test with the third wire among the pluralityof wires of the cable under test, wherein the first and second diodesfacilitate transmittal of the first and second voltage pulses from theselected first wire to the second wire and from the selected second wireto the third wire at the second end of the cable under test.
 26. Thesystem of claim 25, wherein the connection site is fabricated to meetspecifications of a particular cable under test.
 27. The system of claim24, wherein the processor is configured to compare the first and secondvoltage pulses with the pre-determined pattern of at the least onereturning voltage pulse stored in memory to determine the state of thefirst, second, and third wires.
 28. The system of claim 24, wherein thestate of the first, second, and third wires includes at least one ofcable shield integrity, open circuits, short circuits, and shorted toshield.
 29. The system of claim 27, wherein the apparatus is connectedto a faceplate and is enclosed within a protective box.
 30. The systemof claim 26, wherein the faceplate comprises an operator interfaceadapted to be a touch screen display to control the apparatus anddisplay test results.
 31. The system of claim 30, wherein the processoris further operable to configure the operator interface to display aplurality of cables for testing, including the cable under test.
 32. Thesystem of claim 31, wherein the processor is further operable toconfigure the operator interface to display the plurality of wires ofthe cable under test.
 33. The system of claim 32, wherein the processoris further operable to configure the operator interface to manually testthe selected first wire among the plurality of wires of the cable undertest.
 34. The system of claim 32, wherein the processor is furtheroperable to configure the operator interface to automatically test allof the plurality of wires of the cable under test.
 35. The system ofclaim 30, wherein the faceplate further comprises at least one buttonadapted to interface with the operator interface for manually applyingthe first and second voltage pulses to the selected first and secondwires among the plurality of wires of the cable under test.
 36. A methodof assembly, comprising: fabricating a wire-configurable directionalconnector to receive a plurality of wires from a second end of a cableunder test; and fabricating a wire-specific voltage pulse generationmain test unit to generate: a first voltage pulse to selectively enter afirst wire of a first end of the cable under test, travel through thewire-configurable directional connector attached to the second end, andselectively leave at least one of a second wire and a third wire at thefirst end of the cable under test; and a second voltage pulse toselectively enter the second wire at the first end of the cable undertest, travel through the wire-configurable directional connectorattached to the second end, and selectively leave the third wire. 37.The method of assembly of claim 36, wherein fabricating thewire-configurable directional connector further comprises: fabricating aconnection site configured to receive the plurality of wires from thesecond end of a cable under test; operatively connecting a plurality ofconnection wires to the received plurality of wires from the connectionsite; and operatively connecting at least a first diode to the selectedfirst wire among the plurality of wires with the second wire among theplurality of wires of the cable under test and at least a second diodeto the second wire among the plurality of wires of the cable under testwith the third wire among the plurality of wires of the cable undertest, wherein the first and second diodes facilitate transmittal of thefirst and second voltage pulses from the selected first wire to thesecond wire and from the second wire to the third wire at the second endof the cable under test.
 38. The method of assembly of claim 36, whereinfabricating the wire-specific voltage pulse generation main test unitfurther comprises: operatively connecting a processor to at leastmemory, an output module, and an input module; and provisioning a masterbit file indicative of proper continuity between the cable under testand the wire-configurable directional connector into the memory forcomparison with an actual bit file indicative of the actual continuitybetween the cable under test and the wire-configurable directionalconnector.
 39. The method of assembly of claim 36, wherein fabricatingthe wire-specific voltage pulse generation main test unit furthercomprises: connecting the wire-specific voltage pulse generation maintest unit to a faceplate; and enclosing the wire-specific voltage pulsegeneration main test unit within a protective box.